| Author: | Karthik Chandrasekar, Sven Goossens, Christian Weis, Martijn Koedam, Benny Akesson, Norbert WehnORCiD, Kees Goossens |
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| URL: | https://ieeexplore.ieee.org/document/6800387?arnumber=6800387 |
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| DOI: | https://doi.org/10.7873/DATE2014.186 |
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| ISBN: | 978-3-9815370-2-4 |
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| ISSN: | 1558-1101 |
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| Parent Title (English): | Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 |
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| Secondary publication (full text): | https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=dc8bd83ea02f58005fa132cbb7282d339066e31b |
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| Publisher: | IEEE Conference Publications |
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| Place of publication: | New Jersey |
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| Document Type: | Conference Proceeding |
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| Language: | English |
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| Publication year: | 2014 |
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| Year of first Publication: | 2014 |
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| Release Date: | 2024/12/20 |
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| Page Number: | 6 |
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| First Page: | 1 |
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| Last Page: | 6 |
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| Faculties / Organisational entities: | RPTU in Kaiserslautern / Fachbereich Elektrotechnik und Informationstechnik / Entwurf Mikroelektronischer Systeme |
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| Open access state: | Grün Open-Access |
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| RPTU: | Kaiserslautern |
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| Created at the RPTU: | Yes |
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